|
|
Other articles related with "threshold voltage instability"：
|
|
47304 |
Qing Zhu(朱青), Xiao-Hua Ma(马晓华), Yi-Lin Chen(陈怡霖), Bin Hou(侯斌), Jie-Jie Zhu(祝杰杰), Meng Zhang(张濛), Mei Wu(武玫), Ling Yang(杨凌), Yue Hao(郝跃) |
| |
|
Negative bias-induced threshold voltage instability and zener/interface trapping mechanism in GaN-based MIS-HEMTs |
| |
|
|
Chin. Phys. B
2020 Vol.29 (4): 47304-047304
[Abstract]
(611)
[HTML 1 KB]
[PDF 753 KB]
(175)
|
| First page | Previous Page | Next Page | Last Page | Page 1 of 1 |
|
|
